Surface Sensitive Techniques for Advanced Characterization of Luminescent Materials
نویسندگان
چکیده
منابع مشابه
Surface Sensitive Techniques for Advanced Characterization of Luminescent Materials
The important role of surface sensitive characterization techniques such as Auger electron spectroscopy (AES), X-ray photo electron spectroscopy (XPS), time of flight scanning ion mass spectrometry (TOF-SIMS) and High resolution transmission electron microscopy (HRTEM) for the characterization of different phosphor materials is discussed in this short review by giving selective examples from pr...
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ژورنال
عنوان ژورنال: Materials
سال: 2017
ISSN: 1996-1944
DOI: 10.3390/ma10080906